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TDR Probes


Time Domain Reflectometry (TDR) is a convenient way to evaluate impedance values and variations along a transmission line such as cables, connectors or a microstrip on a PC board. At speeds of less than 1Gbps, transmission quality can be analyzed in time domain just as the signal integrity of data signals is often analyzed in time domain. Impedance tolerances are contained in the electrical specifications for many digital system components, such as Rambus, USB, Firewire, and many more. If these tolerances are violated, signal integrity issues become apparent.

The P8018 Handheld TDR Probe is a greater than 20 GHz, 50 Ohm input impedance, single-ended passive probe with a precision 20 GHz bandwidth SMA cable that provides high performance solution for electrical sampling TDR circuit board impedance characterization and high-speed electrical signal analysis applications. The P8018 TDR probe can be used as a stand-alone high bandwidth probe, but it is specially designed with features to be used with the 80A02 EOS/ESD Protection Module for protecting the sampling bridge of Tektronix electrical sampling modules from damage due to electro-overstress (EOS) and electro static discharge (ESD) where large static charges can be stored in the DUT.

The P80318 is an 18GHz 100 Ohm input impedance differential TDR hand probe. The P80318 probe enables high fidelity impedance measurements of differential transmission lines. The adjustable probe pitch enables a wide variety of differential line spacing and impedances. The P80318 TDR probe also includes two precision 20 GHz SMA cables with parallel control lines that provide the 80A02 the control for EOS/ESD protection.

Designed for high volume PCB impedance test applications that require maximum manufacturing up-time, the P80318X TDR hand probe includes everything in a P80318 plus a second probe body for use if the first probe body needs to be serviced due to normal wear. The P80318 probe can be used as a stand-alone high resolution probe, but it is specially designed to be used with two 80A02 EOS/ESD Protection Modules. To maximize testing up-time and minimize repair costs, protecting the sampling module from static damage is a requirement. Damage to the sampling module is typically due to electro-overstress (EOS) and electro static discharge (ESD) from large static charges stored in the DUT. Use of two 80A02 modules ensures proper probe grounding prior to switching signal to the sampling module.

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