The P6330 enables users to make time domain or frequency domain measurements on high bandwidth signals commonly found in digital IC designs, communication applications, and disk drive applications.The P6330 provides high-bandwidth, low circuit loading, and low noise differential probing solutions.The small probe head geometry and assorted probe tip accessories allow the probe to easily accommodate manual probing of surface mount devices.Comes with Certificate of Traceable Calibration
View PDF Tektronix P6330 datasheet.
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Also known as P6330 117635
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